Converting qubit relaxation into erasures with a single fluxonium
Chenlu Liu et al. · 2026 · arXiv
| 编号 QE203 | 主题 玻色子码 | 链接 arXiv:2601.11086 |
摘要
摘要保留原文（英文）
摘要取自 arXiv / 出版方元数据，未作翻译，以保证与原文一致。
Qubits that experience predominantly erasure errors offer distinct advantages for fault-tolerant operation. Indeed, dual-rail encoded erasure qubits in superconducting cavities and transmons have demonstrated high-fidelity operations by converting physical-qubit relaxation into logical-qubit erasures, but this comes at the cost of increased hardware overhead and circuit complexity. Here, we address these limitations by realizing erasure conversion in a single fluxonium operated at zero flux, where the logical state is encoded in its 0-2 subspace. A single, carefully engineered resonator provides both mid-circuit erasure detection and end-of-line (EOL) logical measurement. Post-selection on non-erasure outcomes results in more than four-fold increase of the logical lifetime, from $193μ$s to $869μ$s. Finally, we characterize measurement-induced logical dephasing as a function of measurement power and frequency, and infer that each erasure check contributes a negligible error of . These results establish integer-fluxonium as a promising, resource-efficient platform for erasure-based error mitigation, without requiring additional hardware.
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