Towards fault-tolerance with universal phase-error-transparent gates for high-spin cat codes
Kelvin Onggadinata et al. · 2026 · arXiv
| 编号 QE336 | 主题 容错协议 | 链接 arXiv:2608.05992 |
摘要
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High-dimensional nuclear spins offer a hardware-efficient route to quantum error correction (QEC), with the spin cat code providing intrinsic robustness against phase errors — the dominant noise channel in donor-in-silicon architectures. However, realizing the full potential of this encoding requires gate operations that preserve its error-correcting properties. In this work, we construct a universal logical gate set that is error-transparent (ET) to phase errors, and discuss its practical implementations and challenges. The ET gates ensure that phase errors occurring stochastically during gate operations are propagated in a systematically traceable manner and remain correctable in a subsequent QEC step. Among the universal gate set constructed, we identify the logical gate as the primary challenge and discuss potential realization schemes. In addition, to fully leverage the spin cat code’s advantage over an unencoded qubit, multi-tone microwave driving of the logical gate is essential. Our simulations show that ET gates significantly outperform non-ET gates and may be necessary to surpass the break-even point. We further show how logical measurement and recovery can be c
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