Performance scaling of the quantum Fourier transform with defective rotation gates

Yun Seong Nam, Reinhold Blume · 2015 · Quantum Information and Computation 15(9–10):721–736

| 编号 QQFT013 | 主题 量子傅里叶变换 | 链接 doi:10.26421/qic15.9-10-1 |

摘要

摘要保留原文（英文）

摘要取自 arXiv / 出版方元数据，未作翻译，以保证与原文一致。 Addressing Landauer’s question concerning the influence of static gate defects on quantum information processor performance, we investigate analytically and numerically the case of the quantum Fourier transform (QFT) with defective controlled rotation (CROT) gates. Two types of defects are studied, separately and in combination: systematic and random. Analytical scaling laws of QFT performance are derived with respect to the number of qubits $n$, the size $\delta$ of systematic defects, and the size $ϵ$ of random defects. The analytical results are in excellent agreement with numerical simulations. In addition, we present an unexpected result: The performance of the defective QFT does not deteriorate with increasing $n$, but approaches a constant that scales in $ϵ$. We derive an analytical formula that accurately reproduces the $ϵ$ scaling of the performance plateaus. Overall, we observe that the CROT gates may exhibit static and random defects of the order of 30% and larger, and still result in satisfactory QFT performance. Thus we answer Landauer’s question in the case of the QFT: far from being lethal, the QFT can tolerate tremendous static gate defects and still perform its function. The extraordinary robustness of the QFT with respect to static gate defects displayed in our numerical and analytical calculations should be a welcome boon for laboratory and industrial realizations of quantum circuitry.

可确认的信息

标题陈述的事实是：研究旋转门有缺陷时 QFT 的性能标度。它属于本站近似与截断 QFT一词条讨论的”QFT 对相位误差的容忍度”这条支撑线——注意是门实现有缺陷，与”直接不实现某些小角度门”是不同的误差来源。

本站词条在引用该文献时，会以 wikilink（sources/QQFT013）链接到本页；右侧「反向链接」面板自动列出所有引用它的词条。