Designing fault-tolerant circuits using detector error models

Derks, Peter-Jan H.S., Townsend-Teague, Alex, Burchards, Ansgar G., Eisert, Jens · 2025 · Quantum

| 编号 NA183 | 主题 基准与评测 | DOI 10.22331/q-2025-11-06-1905 |

摘要

摘要保留原文（英文）

摘要取自 arXiv / 出版方元数据，未作翻译，以保证与原文一致。

2025 · Quantum Quantum error-correcting codes, such as subspace, subsystem, and Floquet codes, are typically constructed within the stabilizer formalism, which does not fully capture the idea of fault tolerance needed for practical quantum computing applications. In this work, we explore the remarkably powerful formalism of detector error models, which fully captures fault-tolerance at the circuit level. We introduce the detector error model formalism in a pedagogical manner and provide several examples. Additionally, we apply the formalism to three different levels of abstraction in the engineering cycle of fault-tolerant circuit designs: finding robust syndrome extraction circuits, identifying efficient measurement schedules, and constructing fault-tolerant procedures. We enhance the surface code’s resistance to measurement errors, devise short measurement schedules for color codes, and implement a more efficient fault-tolerant method for measuring logical operators.

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