Measurement-Free Fault-Tolerant Quantum Error Correction in Near-Term Devices

Heußen, Sascha, Locher, David F., Müller, Markus · 2024 · PRX Quantum

| 编号 NA161 | 主题 实验架构与容错 | DOI 10.1103/prxquantum.5.010333 |

摘要

摘要保留原文（英文）

摘要取自 arXiv / 出版方元数据，未作翻译，以保证与原文一致。

2024 · PRX Quantum Logical qubits can be protected from decoherence by performing QEC cycles repeatedly. Algorithms for fault-tolerant QEC must be compiled to the specific hardware platform under consideration in order to practically realize a quantum memory that operates for in principle arbitrary long times. All circuit components must be assumed as noisy unless specific assumptions about the form of the noise are made. Modern QEC schemes are challenging to implement experimentally in physical architectures where in-sequence measurements and feed-forward of classical information cannot be reliably executed fast enough or even at all. Here we provide a novel scheme to perform QEC cycles without the need of measuring qubits that is fully fault-tolerant with respect to all components used in the circuit. Our scheme can be used for any low-distance CSS code since its only requirement towards the underlying code is a transversal CNOT gate. Similarly to Steane-type EC, we coherently copy errors to a logical auxiliary qubit but then apply a coherent feedback operation from the auxiliary system to the logical data qubit. The logical auxiliary qubit is prepared fault-tolerantly without measurements, too. We benchmark logical failure rates of the scheme in comparison to a flag-qubit based EC cycle. We map out a parameter region where our scheme is feasible and estimate physical error rates necessary to achieve the break-even point of beneficial QEC with our scheme. We outline how our scheme could be implemented in ion traps and with neutral atoms in a tweezer array. For recently demonstrated capabilities of atom shuttling and native multi-atom Rydberg gates, we achieve moderate circuit depths and beneficial performance of our scheme while not breaking fault tolerance. These results thereby enable practical fault-tolerant QEC in hardware architectures that do not support mid-circuit measurements.

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